RTG Mikroanalyse GmbH

Focus

microanalysis by means of Secondary Ion Mass Spectrometry (SIMS)
measurement of depth profiles (quantitative and qualitative)
impurity analysis
lateral element distribution
three-dimensional analysis

material composition
Semiconductor materials
optical multilayers
solar cells
metal layers structures
and many more

Categories

• Photonics / Optics
• Analytics
• Spectroscopy / Spectrometry